极低频磁场与儿童急性淋巴细胞白血病的生存率:一项国际随访研究
Extremely low-frequency magnetic fields and survival from childhood acute lymphoblastic leukemia: an international follow-up study
原文发布日期:2012-12-21
DOI: 10.1038/bcj.2012.43
类型: Original Article
开放获取: 是
英文摘要:
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A previous US study reported poorer survival in children with acute lymphoblastic leukemia (ALL) exposed to extremely low-frequency magnetic fields (ELF–MF) above 0.3 μT, but based on small numbers. Data from 3073 cases of childhood ALL were pooled from prospective studies conducted in Canada, Denmark, Germany, Japan, UK and US to determine death or relapse up to 10 years from diagnosis. Adjusting for known prognostic factors, we calculated hazard ratios (HRs) and 95% confidence intervals (CI) for overall survival and event-free survival for ELF–MF exposure categories and by 0.1 μT increases. The HRs by 0.1 μT increases were 1.00 (CI, 0.93–1.07) for event-free survival analysis and 1.04 (CI, 0.97–1.11) for overall survival. ALL cases exposed to >0.3 μT did not have a poorer event-free survival (HR=0.76; CI, 0.44–1.33) or overall survival (HR=0.96; CI, 0.49–1.89). HRs varied little by subtype of ALL. In conclusion, ELF–MF exposure has no impact on the survival probability or risk of relapse in children with ALL.
一项美国先前研究报道称,暴露于0.3μT以上极低频磁场(ELF-MF)的急性淋巴细胞白血病(ALL)患儿生存率较差,但该结论基于少量病例。本研究汇总来自加拿大、丹麦、德国、日本、英国和美国前瞻性研究的3073例儿童ALL数据,评估确诊后10年内的死亡或复发情况。在调整已知预后因素后,我们计算了不同ELF-MF暴露类别及每增加0.1μT的风险比(HR)及其95%置信区间(CI),包括总生存期和无事件生存期。每增加0.1μT的HR值在无事件生存分析中为1.00(CI:0.93-1.07),在总生存分析中为1.04(CI:0.97-1.11)。暴露于>0.3μT的ALL病例并未表现出更差的无事件生存(HR=0.76;CI:0.44-1.33)或总生存(HR=0.96;CI:0.49-1.89)。不同ALL亚型的风险比差异微小。结论:ELF-MF暴露对ALL患儿的生存概率或复发风险无显著影响。
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